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History

1983 AIST/NMIJ* started research on thermophysical properties measurement by Laser Flash method and establishment of national standard.
1990 AIST/NMIJ* started research on thermophysical properties measurement for thin films by thermoreflectance methods.
2006 April Adopted AIST Innovation Center for Start-ups.
2008 March Thermal Analysis System - NanoTR completed.
2008 May PicoTherm Corporation was established.
Received the title of AIST Start-ups.
2008 June Launched measurement and analysis service for measuring thermophysical properties
of thin films
2010 September Launched sales of Thermal Analysis System - NanoTR
2011 July Sales representation agreement with Quantum Design Japan, Inc.
2012 December New product release - Thermal Analysis System - PicoTR
2013 June “Joyo Business Award 2013” Excellence (Rose) Award
“2nd New Business Plan Competition for Women Entrepreneurs” finalist
2014 January Sales representation agreement with NETZSCH JAPAN

*National Institute of Advanced Industrial Science and Technology/National Metrology Institute of Japan